Trends in Electronic Parts Susceptibility to Single Event Upset Space Station Environment (JPL D-2767)
September 1985 - Spiral bound. 48 pages, some handwriting inside, notes.
By D.K. Nichols - Radiation Effects Group, Electronic Parts Reliability Section.
This is from the private library of the Southern California estate of Mark A. Huebner who worked for JPL in the Radiation Effect & Testing, Electronic Parts Reliability section! His work at JPL was in support of the space radiation hardness studies for the spacecraft Gallileo, Magellan, Ullysses, and others. His role was Particle Beam Engineer for the Radiation Effects Test group. He also presented a paper at the 1989 IEEE Conference On Real Time Computer Applications in Nuclear, Particle and Plasma Physics!
Also included is a copy of Huebner's one page resume.